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Fault Detection for Covered Conductors With High-Frequency Voltage Signals: From Local Patterns to Global Features
2021
Chen, Kunjin
;
Vantuch, Tomáš
;
Zhang, Yu
;
Hu, Jun
;
He, Jinliang
Published Web Location
https://doi.org/10.1109/tsg.2020.3032527
...
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