Lawrence Berkeley National Laboratory

Organic photovoltaics (OPV) are a sustainable and inexpensive source of energy comprised of a mixture of an electron-donating and an electron-accepting material (often a polymer and fullerene derivative, respectively) to create a bulk heterojunction (BHJ). However, these devices are held back by low efficiencies. Improving the efficiency in a systematic way requires a comprehensive understanding of the device function and microstructure, but directly imaging the subsurface active layer structure is challenging. Here we demonstrate that ptychography may be used to image the OPV active layer with good film stability and materials contrast in both polymer:fullerene and all-polymer BHJ films. This is possible using soft X-ray ptychography available at the Advanced Light Source beamline 5.3.2.1. We achieve a resolution of 30-50 nm with no discernible radiation damage and discuss the potential for further improvements. This characterization technique could complement widely used electron microscopy and soft X-ray scattering.