This paper analyzes prospects for developing a test device suitable for field verification of the types of low-emittance (low-e) coatings present on high-performance window products. Test devices are currently available that can simply detect the presence of low-e coatings and that can measure other important characteristics of high-performance windows, such as the thickness of glazing layers or the gap in dual glazings. However, no devices have yet been developed that can measure gas concentrations or distinguish among types of coatings. This paper presents two optical methods for verification of low-e coatings. The first method uses a portable, fiber-optic spectrometer to characterize spectral reflectances from 650 to 1,100 nm for selected surfaces within an insulated glazing unit (IGU). The second method uses an infrared-light-emitting diode and a phototransistor to evaluate the aggregate normal reflectance of an IGU at 940 nm. Both methods measure reflectance in the near (solar) infrared spectrum and are useful for distinguishing between regular and spectrally selective low-e coatings. The infrared-diode/phototransistor method appears promising for use in a low-cost, hand-held field test device.

In a highly collaborative research and development project with mining and university partners, sensors and data-analysis tools are being developed for rock-mass characterization and real-time measurement of mineral content. Determining mineralogy prior to mucking in an open-pit mine is important for routing the material to the appropriate processing stream. A possible alternative to lab assay of dust and cuttings obtained from drill holes is continuous on-line sampling and real-time x-ray fluorescence (XRF) spectroscopy. Results presented demonstrate that statistical analyses combined with XRF data can be employed to identify minerals and, possibly, different rock types. The objective is to create a detailed three-dimensional mineralogical map in real time that would improve downstream process efficiency.