TEM COMBINED WITH AlxGa1-x AS MARKER LAYERS AS A TECHNIQUE FOR THE STUDY OF GaAs MBE GROWTH

ATOMIC STRUCTURE OF THE SILICON/SILICON DIOXIDE INTERFACE

TEM INVESTIGATION OF POLAR-ON-NONPOLAR EPITAXY: GaAs-AlGaAs ON (100) Ge

THE ATOMIC STRUCTURE OF Si-SiO2 INTERFACES SUGGESTING A LEDGE MECHANISM OF SILICON OXIDATION

HIGH-RESOLUTION ELECTRON MICROSCOPY STUDY OF SILICA AEROGEL TRANSPARENT INSULATION

HIGH RESOLUTION TEM STUDIES OF DEFECTS NEAR Si-SiO2 INTERFACE

OXIDATION OF SINGULAR AND VICINAL SURFACES OF SILICON: THE STRUCTURE OF Si-SiO2 INTERFACE

HIGH RESOLUTION ELECTRON MICROSCOPY STUDIES OF NATIVE OXIDE ON SILICON