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Scholarly Works (7 results)
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Article
The Study on the Real Defect on EUV Blankmask and Strategy of EUV Mask Inspection
Huh, S.
Lawrence Berkeley National Laboratory
(2010)
Article
Peer Reviewed
A study of defects on EUV mask using blank inspection, patterned mask inspection, and wafer inspection
Huh, S.
Lawrence Berkeley National Laboratory
(2010)
Article
Printability and inspectability of Defects on the EUV Mask for sub32nm Half Pitch HVM Application
Huh, S.
Lawrence Berkeley National Laboratory
(2011)
Article
Zoneplate lenses for EUV microscopy
Mochi, Iacopo
;
Goldberg, Kenneth A.
;
Anderson, E. H.
;
Huh, S.
LBL Publications
(2009)
Article
Achieving diffraction-limited EUV aerial image microscopy
Mochi, Iacopo
;
Goldberg, Kenneth A.
;
Huh, S.
;
Naulleau, P.
LBL Publications
(2008)
Article
Peer Reviewed
Eliminating disparities in diabetes care: The impact of disease management strategies within triad.
Duru, O
;
Mangione, CM
;
Karter, AJ
;
Kountz, DS
;
Safford, MM
;
Tseng, C
;
Waitzfelder, B
;
Gerzoff, R
;
Huh, S
;
Steers, W
;
Brown, A
UCLA Previously Published Works
(2005)
Article
Effects of carbon contamination on the printing performance of extreme ultraviolet masks
Fan, Y.-J.
;
Yankulin, L.
;
Antohe, A.
;
Thomas, P.
;
Mbanaso, C.
;
Garg, R.
;
Wang, Y.
;
Wuest, A.
;
Goodwin, F.
;
Huh, S.
;
Naulleau, P.
;
Goldberg, K.
;
Movhi, I.
;
Denbeau, G.
LBL Publications
(2010)
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