Analog reservoir computing (ARC) systems have attracted attention owing to their efficiency in processing temporal information. However, the distinct functionalities of the system components pose challenges for hardware implementation. Herein, we report a fully integrated ARC system that leverages material versatility of the ferroelectric-to-mixed phase boundary (MPB) hafnium zirconium oxides integrated onto indium-gallium-zinc oxide thin-film transistors (TFTs). MPB-based TFTs (MPBTFTs) with nonlinear short-term memory characteristics are utilized for physical reservoirs and artificial neuron, while nonvolatile ferroelectric TFTs mimic synaptic behavior for readout networks. Furthermore, double-gate configuration of MPBTFTs enhances reservoir state differentiation and state expansion for physical reservoir and processes both excitatory and inhibitory pulses for neuronal functionality with minimal hardware burden. The seamless integration of ARC components on a single wafer executes complex real-world time-series predictions with a low normalized root mean squared error of 0.28. The material-device co-optimization proposed in this study paves the way for the development of area- and energy-efficient ARC systems.

Ferroelectric (FE) materials are key to advancing electronic devices owing to their non-volatile properties, rapid state-switching abilities, and low-energy consumption. FE-based devices are used in logic circuits, memory-storage devices, sensors, and in-memory computing. However, the primary challenge in advancing the practical applications of FE-based memory is its reliability. To address this problem, a novel polarization pruning (PP) method is proposed. The PP is designed to eliminate weakly polarized domains by applying an opposite-sign pulse immediately after a program or erase operation. Significant improvements in the reliability of ferroelectric devices are achieved by reducing the depolarization caused by weakly polarized domains and mitigating the fluctuations in the ferroelectric dipole. These enhancements include a 25% improvement in retention, a 50% reduction in read noise, a 45% decrease in threshold voltage variation, and a 72% improvement in linearity. The proposed PP method significantly improves the memory storage efficiency and performance of neuromorphic systems.