Solar water splitting has gained increasing attention as a sustainable approach for producing clean hydrogen fuel. However, achieving the theoretical energy conversion efficiency of photocatalyst materials remains challenging due to limiting control over carrier separation in semiconductor photocatalysts. This dissertation explores doping, nanostructuring, and surface states as key factors affecting carrier separation, providing insights into the relationship between electronic property and performance. Semiconducting photocatalysts were prepared via solid state reaction, sol-gel reaction, electrodeposition, or sourced commercially. Their structural and optoelectronic properties were characterized using electron microscopies, X-ray diffraction (XRD). UV-Vis spectroscopy, surface photovoltage spectroscopy (SPS), X-ray photoelectron spectroscopy (XPS), and electron paramagnetic resonance (EPR) spectroscopy. Photocatalytic performance was evaluated by photocatalytic oxygen evolution and photoelectrochemical (PEC) measurements with different redox active species.In Chapter 2, we explored p-type aliovalent doping strategies in BiVO4 hoping to optimize carrier separation and enhance photocurrent without compromising photovoltage, using microcrystal BiVO4 and nanoporous BiVO4 films as model systems. In the microcrystal system, monoclinic BiVO4 microparticles were synthesized through a room-temperature method with in situ Sr doping using Sr(NO3)2. The synergistic effect of 5 % Sr doping and Ar annealing led to a photocurrent density of 260 μA/cm2 at 1.23 V vs. RHE for sulfite oxidation under intensified Xe irradiation, representing 5.7-fold enhancement over pristine BiVO4. However, this enhancement diminished under 1-Sun illumination. Ar-annealed BiVO4 microparticles exhibited a visible-light-driven oxygen evolution rate of 202 μmol/h under 550 mW/cm2 irradiation, but Sr doping provided no further improvement. Sr was not detected in BiVO4:Sr by EDX or XPS, likely due to inefficient dopant incorporation at low temperature. In the nanoporous system, p-type aliovalent doping with Ca, Sr, or Ti was attempted at 500°C using electrodeposited BiVO4 films. Ca doping led to limited photocurrent enhancement from 1.56 to 1.73 mA/cm2 for sulfite oxidation under 1-Sun illumination. While Sr doping and Ti doping consistently reduced photocurrent. EPR analysis confirmed the absence of detectable V4+ in pristine BiVO4. N,p co-doping with 0.5 % Mo and Ca/Ti was also explored, achieving a photocurrent density of 2.94 mA/cm2 with Mo doping alone, but no additional enhancement with Ca or Ti.
In Chapter 3, we demonstrate the synthesis, characterization, and the corresponding photocatalytic application of single crystal BiVO4 nanowires. In this study, single-crystal BiVO4 nanowires were synthesized for the first time by recrystallization of BiVO4 microparticles from NaVO3 flux at 700°C – 550°C, exhibiting an average thickness of 433.4 ± 110.6 nm with lengths exceeding 20 μm. XRD and electron microscopy confirmed their single crystallinity with a monoclinic Scheelite structure, growing along the [010] direction. With a band gap of 2.41 eV, the nanowires demonstrate photocatalytic activity under visible light (390 mW/cm²), achieving a water oxidation rate of 28.75 µmol/h and an apparent quantum efficiency of 0.44 % at 405 nm. Photolabeling experiments with silver and manganese 2+ ions demonstrate that both photoholes and electrons are extracted along the cylindrical nanowire surface. The absence of a facet-induced charge separation mechanism explains the relatively low photocatalytic activity of the nanowires. Despite this, the unique morphology of nanowire BiVO4 holds significant potential for applications in sustainable energy conversion and photocatalysis.
In Chapter 4, we demonstrate the application of X-ray photoelectron spectroscopy (XPS) on electronic property characterization in semiconductor photocatalysts and their devices in three systems. In Chapter 4.1, the defect chemistry of single crystal SrTiO3 (111) annealed in H2 at 1050 ℃ with electric polarization was investigated using XPS. After H2 treatment, a Fermi level shift of 0.58 eV towards a more reducing level was observed, indicated by consistent shifts in the Sr, Ti, and O elemental peaks in XPS. The increased abundance of surface -OH signals in O 1s spectra confirms the successful incorporation of oxygen vacancies. And the negligible change in Sr, Ti, O signals after both reverse and forward polarizations rules out electron segregation as the cause of local polarization. In Chapter 4.2, XPS was employed with SPS on as-purchased n-GaP to investigate the chemical origin of an unknown surface defect state located 1.3 eV below its conduction band. Two separate surface treatments, air oxidation at 600°C and surface coating with a metallic Ga layer, were conducted on the bare n-GaP surface for XPS analysis to decouple the contributions of surface oxides and metallic Ga. A metallic Ga(0) shoulder peak, with an 1.98 eV energy difference from the major peak, was detected on the as-received n-GaP surface and identified as the source of the 1.3 eV defect level. These findings provide critical insights for surface treatments in GaP-based devices. In Chapter 4.3, detailed XPS analysis was performed on various substrate/Bi2S3 photoanodes to obtain surface chemistry information and the valence band edge position. From the measured 0.92 eV valence band onset and other optoelectronic data, a Schottky-junction model was derived to successfully explains the substrate-dependent photocurrent trends observed in the photoanodes when different conductive substrates were employed.